Abstract
The importance of field ion microscopy as a unique surface microscopic technique has been pointed out with particular reference to the lanthanum hexaboride (LaB6)-deposited refractory metal cathodes. In the core, field ion microscopic observations of LaB6 deposited tungsten are described. The observations are discussed in relation to the field electron emission microscopy of LaB6/W system. The paper ends with a few comments on the scope of further study of this or a similar system using the field ion microscopy and the atom probe field ion microscope.
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Joag, D.B., Kanitkar, P.L., Kanitkar, M.M. et al. Field ion microscopic observations of LaB6 on tungsten. Bull. Mater. Sci. 6, 573–577 (1984). https://doi.org/10.1007/BF02744085
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DOI: https://doi.org/10.1007/BF02744085