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Influence of incident beam divergence on the intensity of diffuse streaks

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Abstract

The influence of incident beam divergence on the length of the streak intercepted by the Ewald sphere is considered, as a relpHK·L of a faulted hexagonal crystal, mounted about itsc-axis on the goniometer head attached to the ø-circle, is brought into diffracting condition for the bisecting setting of a 4-circle diffractometer. For the special crystal mounting correction factors required to convert the measured intensities corresponding to a fixed length of the streak are derived. A procedure for experimentally verifying the mathematical approach employed in these derivations is also presented.

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Authors and Affiliations

  1. School of Materials Science and Technology, Banaras Hindu University, 221 005, Varanasi, India

    Dhananjai Pandey

  2. Department of Metallurgical Engineering, Banaras Hindu University, 221 005, Varanasi, India

    S Lele & Lalita Prasad

  3. Laboratoire de Mineralogie-Cristallographie, Universite’ Claude Bernard Lyon I, 69622, Villeurbanne Cedex, France

    J P Gauthier

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  1. Dhananjai Pandey
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  2. S Lele
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  3. Lalita Prasad
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  4. J P Gauthier
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Pandey, D., Lele, S., Prasad, L. et al. Influence of incident beam divergence on the intensity of diffuse streaks. Bull. Mater. Sci. 7, 499–507 (1985). https://doi.org/10.1007/BF02744060

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  • DOI: https://doi.org/10.1007/BF02744060

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