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Study of solids and surfaces with polarization-dependent angle-resolved photoemission

Исследование твердых тел и поверхностей с помощью разрешенной по углам фотоэмиссии, зависящей от поляризации

  • Published:
Il Nuovo Cimento B (1971-1996)

Summary

Angle-resolved UV photoemission spectroscopy with synchrotron radiation is used to study the quantum structure of bulk and surface states of GaAs (110). The results are used to illustrate methods of utilizing the measured momentum in obtaining and analyzing angle-resolved data. Strong optical-polarization effects observed in the angle-resolved data are analyzed in terms of mirror plane symmetry properties.

Riassunto

Si usa la spettroscopia di fotoemissione nell’UV risolta in angolo con radiazione di sincrotrone per studiare la struttura quantica degli stati di superficie e di volume del GaAs (110). Si usano i risultati per mostrare metodi di utilizzazione dell’impulso misurato nell’ottenere e analizzare i dati risolti in angolo. Si analizzano i forti effetti di polarizzazione ottica osservati nei dati risolti in angolo in termini di proprietà di simmetria speculare nel piano.

Резюме

Для исследования квантовой структуры объемных и поверхностных состояний GaAs (110) используется разрешенная по углам спектроскопия фотоэмиссии в ультрафиолетовой области. Полученные результаты применяются для иллюстрации методов, использующих измеренный импульс для получения и анализа разрешенных по углам данных. Наблюдаемые сильные эффекты оптической поляризации в разрешенных по углам данных анализируются в терминах свойств симметрии плоского зеркала.

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Footnotes

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Author notes

  1. J. A. Knapp & G. J. Lapeyre

    Present address: Montana State University, 59715, Bozeman, Mont., U.S.A.

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    1. J. A. Knapp
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    2. G. J. Lapeyre
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    Additional information

    Research sponsored by the U.S. Air Force Office of Scientific Research, Air Force Systems Command, under Grant No. 75-2872. The University of Wisconsin Synchrotron Radiation Center is sponsored by NSF Grant No. DMR-7415089.

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    Knapp, J.A., Lapeyre, G.J. Study of solids and surfaces with polarization-dependent angle-resolved photoemission. Nuov Cim B 39, 693–703 (1977). https://doi.org/10.1007/BF02725812

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    • DOI: https://doi.org/10.1007/BF02725812

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