Bulletin of Materials Science

, Volume 26, Issue 2, pp 239–245 | Cite as

Studies on thin film materials on acrylics for optical applications

  • K. Narasimha Rao
Article

Abstract

Deposition of durable thin film coatings by vacuum evaporation on acrylic substrates for optical applications is a challenging job. Films crack upon deposition due to internal stresses and leads to performance degradation. In this investigation, we report the preparation and characterization of single and multi-layer films of TiO2, CeO2, Substance2 (E Merck, Germany), Al2O3, SiO2 and MgF2 by electron beam evaporation on both glass and PMMA substrates. Optical micrographs taken on single layer films deposited on PMMA substrates did not reveal any cracks. Cracks in films were observed on PMMA substrates when the substrate temperature exceeded 80°C. Antireflection coatings of 3 and 4 layers have been deposited and characterized. Antireflection coatings made on PMMA substrate using Substance2 (H2) and SiO2 combination showed very fine cracks when observed under microscope. Optical performance of the coatings has been explained with the help of optical micrographs.

Keywords

Coatings on acrylics dielectric thin films optical coatings low temperature coatings oxide films antireflection coatings 

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References

  1. Allen J and Tregunna A 1988J. Phys. D: Appl. Phys. 21 S92CrossRefGoogle Scholar
  2. Baldwin D B, Ramsey J B and Miles JE 1997Proc. of 40th annual technical conference (New Orlean, LA: Society of Vacuum Coaters) p. 243Google Scholar
  3. Coating Materials brochure of E Merck, Germany 1998 and of Balzers Ltd 1995Google Scholar
  4. Chow R, Spragge M K, Loomis G E, Rainer F, Ward R L, Thomas I M and Kozlowski M R 1994Mater. Res. Soc. Symp. Proc. 328 731Google Scholar
  5. Diggins D R 1998Mater. Forum 22 25Google Scholar
  6. Ganesh Shanbhogue, Nagendra C L, Annapurna M N, Ajith Kumar S and Tuttupalli G K M 1997Appl. Opt. 36 6339CrossRefGoogle Scholar
  7. Ghanshyam Krishna M, Narasimha Rao K and Mohan S 1993J. Appl. Phys. 73 34Google Scholar
  8. Jesse D Wolfe 1992Surf. & Coat. Technol. 52 99CrossRefGoogle Scholar
  9. John R Hollhan, Theodore Wydeven and Catherine C Johnson 1974Appl. Opt. 13 1844Google Scholar
  10. Mansour S Al-Robaee, Narasimha Rao K and Mohan S 1992J. Appl. Phys. 71 2380CrossRefGoogle Scholar
  11. Mansour S Al-Robaee, Subbanna G N, Narasimha Rao K and Mohan S 1994Vacuum 45 97CrossRefGoogle Scholar
  12. Pulker H K 1979Appl. Opt. 18 1969Google Scholar
  13. Samson Frank 1996Surf. & Coat. Technol. 81 79CrossRefGoogle Scholar
  14. Schulz U, Kaiser N and Zoller A 1998OSA Technical Digest 9 187Google Scholar
  15. Swanepoel R 1983J. Phys. E 16 1214CrossRefGoogle Scholar
  16. Szczybrowski J, Brauer G, Teschner G and Zmelty A 1997J. Non-Cryst. Solids 218 25CrossRefGoogle Scholar
  17. Usui H, Koshikawa and Tanaka K J 1995Vac. Sci. Technol. A13 2318CrossRefGoogle Scholar
  18. Wydeven T 1977Appl. Opt. 16 717CrossRefGoogle Scholar

Copyright information

© Indian Academy of Sciences 2003

Authors and Affiliations

  • K. Narasimha Rao
    • 1
  1. 1.Department of InstrumentationIndian Institute of ScienceBangaloreIndia

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