Skip to main content
Log in

Multielement trace determination in high purity advanced ceramics and high purity metals

  • Published:
Bulletin of Materials Science Aims and scope Submit manuscript

Abstract

In the field of advanced ceramics two CRMs were developed in the last few years by the Federal Institute for Materials Research and Testing, one for silicon nitride and one for silicon carbide. Besides their application by industry they are appropriate to be used for the validation of special methods used for trace determination in accordance with high purity materials. This is demonstrated, for example, on ultrapure silicon carbide which was analysed by solid sampling electrothermal atomic absorption spectrometry (SS ET AAS).

BAM is also certifying primary pure reference materials used as the National Standards for inorganic analysis in Germany. The crucial point of this project is the certification of the total purity of high purity materials, each representing one element of the periodic table. A variety of different analytical methods was necessary to determine the trace contents of metallic and non-metallic impurities from almost the whole periodic table in the high purity materials. The primary CRMs of copper, iron and molybdenum are used as examples to demonstrate the modus operandi, analytical effects observed by using high resolution ICP mass spectrometry (HR ICP-MS) and the results.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  • Friese K-Ch and Krivan V 1995Anal. Chem. 67 354

    Article  CAS  Google Scholar 

  • Kipphardt H 2004 Certification Report, BAM-Y001, BAM, Federal Institute for Materials Research and Testing

  • Kurfürst U 1998Solid sample analysis—Direct and slurry sampling using GF-AAS and ETV-ICP (Berlin, Heidelberg: Springer-Verlag)

    Google Scholar 

  • Matschat R, Meyer K, Heinrich H-J and Scharf H 1999Advances in process measurements for the ceramic industry (eds) A Jillavenkatesa and G J Onoda (Westerville, Ohio: The American Ceramic Society) p. 107

    Google Scholar 

  • Matschat R, Czerwensky M, Pattberg S and Heinrich H-J 2002Mater. Trans.—Jap. Inst. Metals 43 90

    CAS  Google Scholar 

  • Matschat R, Czerwensky M, Traub H, Heinrich H-J and Kipphardt H 2003Matériaux & Techniques Nℴ Hors Série, December 2003, 37

  • Meyer K and Matschat R 2000 inReference materials in analytical chemistry (ed.) A Zschunke (Heidelberg: Springer Verlag) p. 57

    Google Scholar 

  • Schäffer U and Krivan V 2001Fresenius J. Anal. Chem. 371 859

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to R. Matschat.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Matschat, R., Heinrich, H.J., Czerwensky, M. et al. Multielement trace determination in high purity advanced ceramics and high purity metals. Bull Mater Sci 28, 361–366 (2005). https://doi.org/10.1007/BF02704250

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF02704250

Keywords

Navigation