X-ray topography for fractography of single-crystal components
- 74 Downloads
X-ray diffraction topography is a new tool that may help fractographic analysis of single-crystal structural materials. It is sensitive to local strain and/or crystallographic orientation and provides a unique view of single-crystal samples both before and after fracture. It can find strength-and performance-limiting surface and subsurface flaws that are undetectable by other methods or are detectable only with great difficulty and provides a complementary view of the fracture surface. The attributes of synchrotron-based X-ray topography as applied to fractography are described and illustrated with examples from recent experiments on sapphire.
Keywordscracking fractography inspections
Unable to display preview. Download preview PDF.
- 1.V.D. Fréchette: Failure Analysis of Brittle Materials: Advances in Ceramics, Volume 28, American Ceramic Society, Westerville, OH, 1990.Google Scholar
- 2.R. Cayse, P. Lagerlöf, R. Polvani, D. Harris, D. Platus, D. McClure, C. Patty, and D. Black: “Sapphire Statistical Characterization and Risk Reduction Program Final Report,” SETAC Contract DASG60-97-D-002, Nichols Research Corp., Huntsville, AL, Apr 28, 2000.Google Scholar
- 4.B.K. Tanner: X-Ray Diffraction Topography, Pergamon Press plc, Oxford, 1976.Google Scholar
- 5.K. Tanner: “Contrast of Defects in X-Ray Diffraction Topographs,” X-Ray and Neutron Dynamical Diffraction Theory and Applications, A. Authier, S. Lagomarsino, and B.K. Tanner, ed., Plenum Press, New York, 1996.Google Scholar
- 6.B.K. Bowen and B. Tanner: High Resolution X-Ray Diffractometry and Topography, Taylor and Francis, London, 1998.Google Scholar
- 7.D.R. Black and G.G. Long: “X-ray Topography,” NIST Recommended Practice Guide, NIST Special Publication, SP 960-10, 2004.Google Scholar
- 10.J.-F. Petroff: “Basic Understanding of Image Formation in X-ray Topography,” Applications of X-Ray Topographic Methods to Materials Science, S. Weissmann, F. Balibar, and J.-F. Petroff, ed., Plenum Press, New York, 1984, pp. 75–96.Google Scholar
- 11.B.D. Cullity: Elements of X-Ray Diffraction, Addison-Wesley, Reading, 1967, pp. 118–23.Google Scholar
- 12.D. Black, R. Polvani, K. Medicus, and H. Burdette: “X-Ray Topography Study of Surface Damage in Single-Crystal Sapphire,” Mat. Res. Soc. Symp. Proc., 2000, 590, pp. 279–84.Google Scholar