Skip to main content
SpringerLink
Log in

Combinatorial design approaches for automatic test generation

  • Letters
  • Published:
Journal of Electronics (China)

Abstract

The n-way combination testing is a specification-based testing criterion, which requires that for a system consisted of a new parameters, every combination of valid values of arbitrary n(n≥2) parameters be covered by at least one test. This letter proposed two different test generation algorithms based on combinatorial design for the n-way coverage criterion. The automatic test generators are implemented and some valuable empirical results are obtained.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

References

  1. Robert Mandl, Orthogonal Latin squares: An application of experimental design to compiler testing, Communications of the ACM, 28(1985)10, 1054–1058.

    Article  Google Scholar 

  2. David M. Cohen, Siddhartha R. Dalal, et al., The AETG system: An approach to testing based on combinatorial design, IEEE Trans. on Software Engineering, 23(1997)7, 437–444.

    Article  Google Scholar 

  3. David M. Cohen, Siddhartha R. Dalal, et al., The combinatorial design approach to automatic test generation, IEEE Software, 13(1996)5, 83–89.

    Article  Google Scholar 

  4. Yu Lei, Kuo-Chung Tai, In-parameter-order: A test generation strategy for pairwise testing, Technical Report TR-2001-03, Dept. of Computer Science, North Carolina State Univ, Raleigh, North Carolina, March 2001.

    Google Scholar 

  5. Kuo-Chung Tai, Yu Lei, A test generation strategy for pairwise testing, IEEE Trans. on Software Engineering, 28(2002)1, 109–111.

    Article  Google Scholar 

  6. Baowen Xu, Changhai Nie, et al., An algorithm for automatically generating black-box test cases, Journal of Electronics(China), 20(2003)1, 74–77.

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Dept of Computer Science & Eng., Southeast University, 210096, Nanjing, China

    Shi Liang, Xu Baowen & Nie Changhai

  2. Jiangsu Institute of Software Quality, 210096, Nanjing, China

    Xu Baowen

  3. Dept of Computer, National University of Defense Technology, 410073, Changsha, China

    Xu Baowen

Authors
  1. Shi Liang
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Xu Baowen
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Nie Changhai
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

Supported in part by National Natural Science Foundation of China (No.60373066), National Grand Fundamental Research 973 Program of China (2002CB312000), National Research Foundation for the Doctoral Program of Higher Education of China (20020286004)

Communication author: Shi Liang, born in 1979, male, graduate student. Department of Computer Science & Engineering, Southeast University, Nanjing 210096, China.

About this article

Cite this article

Shi, L., Xu, B. & Nie, C. Combinatorial design approaches for automatic test generation. J. of Electron.(China) 22, 205–208 (2005). https://doi.org/10.1007/BF02688150

Download citation

  • Received:

  • Revised:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF02688150

Key words

Search

Navigation