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Measuring C program coverage based on binary decision diagrams

  • Letters
  • Published:
Journal of Electronics (China)

Abstract

Test coverage analysis is a structural testing technique, which helps to evaluate the sufficiency of software testing. This letter presents two test generation algorithms based on binary decision diagrams to produce tests for the Multiple-Condition Criterion(M-CC) and the Modified Condition/Decision Criterion(MC/DC), and describes the design of the C program Coverage Measurement Tool (CCMT), which can record dynamic behaviors of C programs and quantify test coverage.

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Author information

Authors and Affiliations

  1. Dept of Computer Science & Eng., Southeast University, 210096, Nanjing, China

    Shi Liang, Xu Baowen & Chen Lin

  2. Jiangsu Institute of Software Quality, 210096, Nanjing, China

    Xu Baowen

  3. Dept of Computer, National University of Defense Technology, 410073, Changsha, China

    Xu Baowen

Authors
  1. Shi Liang
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  2. Xu Baowen
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  3. Chen Lin
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Additional information

Supported in part by National Natural Science Foundation of China (No.60373066), National Grand Fundamental Research 973 Program of China (2002CB312000), National Research Foundation for the Doctoral Program of Higher Education of China (20020286004)

Communicate author: Shi Liang, born in 1979, male, graduate student. Department of Computer Science & Engineering, Southeast University, Nanjing 210096, China.

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Shi, L., Xu, B. & Chen, L. Measuring C program coverage based on binary decision diagrams. J. of Electron.(China) 22, 90–93 (2005). https://doi.org/10.1007/BF02687957

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  • DOI: https://doi.org/10.1007/BF02687957

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