Skip to main content
SpringerLink
Log in

An algorithm for fault diagnosis based on combinatorial design approach for testing

  • Letters
  • Published:
Journal of Electronics (China)

Abstract

Much research has been done mainly in testcase generation and its effect for combinatorial design approach for testing. This letter presents an algorithm for fault diagnosis based on the approach. It can conclude that the factors, which cause errors, must be in a very small range through analyzing the test cases after testing, and retesting with some complementary test cases. The algorithm can provide a very efficient and valuable guidance for the debugging and testing of software.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

References

  1. E. Heller, Using design of experiment structures to generate test cases, Proc. 12th Int’l Conf. Testing Computer Software, New York, ACM, 1995, 33–41.

    Google Scholar 

  2. D. M. Cohen, et al., The AETG system: An approach to testing based on combinatorial design, IEEE Trans. on Software Engineering, 23(1997)7, 437–444.

    Article  Google Scholar 

  3. D. M. Cohen, et al., The combinatorial design approach to automatic test generation, IEEE Software Magazine, 13(1996)9, 83–87.

    Google Scholar 

  4. Y. Lei, K. C. Tai, In-parameter-oder: A test generation strategy for pairwise testing, Technical Report TR-2001-03, Dept. of Computer Science, North Carolina State Univ, Raleigh, North Carolina, Mar. 2001.

    Google Scholar 

  5. K. C. Tai, Y. Lei, A test generation strategy for pairwise testing, IEEE Trans. on Software Engineering, 28(2002)1, 109–111.

    Article  Google Scholar 

  6. Noritaka Kobayashi, Tatssuhio Tsuchiya, Tohru Kikuno, A new method for constructing pair-wise covering designs for software testing, Information Processing Letters, 81(2002)2, 85–91.

    Article  MATH  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Dept. of Computer Science & Eng., Southeast Univ., 210096, Nanjing

    Nie Changhai, Xu Baowen & Shi Liang

  2. State Key Laboratory of Software Engineering, Wuhan University, 430072, Wuhan

    Xu Baowen

  3. Jiangsu Key Lab. of Computer Info. Proc. Tech., Soochow Univ., 215006, Suzhou

    Xu Baowen

Authors
  1. Nie Changhai
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Xu Baowen
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Shi Liang
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

Supported in part by the National Natural Science Foundation of China (60073012), Natural Science Foundation of Jiangsu Province, China (BK2001004), Opening Foundation of State Key Laboratory of Software Engineering in Wuhan University, Opening Foundation of Jiangsu Key Laboratory of Computer Information Processing Technology in Soochow University, National Grand Fundamental Research 973 Program of China(G1999032701), National Research Foundation for the Doctoral Program of Higher Education of China.

About this article

Cite this article

Nie, C., Xu, B. & Shi, L. An algorithm for fault diagnosis based on combinatorial design approach for testing. J. of Electron.(China) 20, 224–226 (2003). https://doi.org/10.1007/BF02687709

Download citation

  • Received:

  • Revised:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF02687709

Key words

Search

Navigation