Abstract
XPS and Raman spectroscopy are combined to evaluate the stoichiometry and charge state of building units in conductive films containing TTF, ET or TMTSF donors and [Ni(dmit)2] or [M(dcbdt)2] acceptors.
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Valade, L., Fraxedas, J., de Caro, D. et al. An approach to the origin of transport properties in a series of molecular conductors, based on XPS and spectroscopic studies. J Low Temp Phys 142, 141–146 (2006). https://doi.org/10.1007/BF02679483
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DOI: https://doi.org/10.1007/BF02679483