Abstract
Analytical electron microscopy (AEM) has provided structural, crystallographic, and compositional characterization to aid in the understanding of radiation damage processes, especially in multiphase materials. The range of AEM techniques is based on the use of as many of the signals produced by the interaction of an electron beam with a specimen as possible. This paper briefly discusses the origins, capabilities, and current developments of AEM, including the spatial resolution of the various techniques. Several important applications of AEM in radiation damage studies, including radiation-induced segregation and phase instability in austenitic stainless steels, will be reviewed. From the comparison of phase equilibria under irradiation to that under thermal aging, principles for alloy development in non-nuclear applications will be discussed.
Similar content being viewed by others
References
Introduction to Analytical Electron Microscopy, J.J. Hren, J.I. Goldstein, and D.C. Joy, eds., Plenum Press, New York, NY, 1979.
Principles of Analytical Electron Microscopy, D.C. Joy, A.D. Romig, Jr., and J.I. Goldstein, Plenum Press, New York, NY, 1986.
D.B. Williams:Practical Analytical Electron Microscopy in Ma- terials Science, Philips Electron Optics Publishing, Mahwah, NJ, 1984.
M.H. Loretto:Electron Beam Analysis of Materials, Chapman and Hall, New York, NY, 1984.
E.A. Kenik:Scripta Metall., 1987, vol. 21, pp. 811–26.
R.F. Egerton:Electron Energy Loss Spectroscopy in the Electron Microscope, Plenum Press, New York, NY, 1986.
J. Bentley,L.D. Stephenson, R.B. Benson, P.A. Parrish, and J.K. Hirvonen:Ion Implantation and Ion Beam Processing of Materials, MRS Symp. Proc, G.W. Hubler, O.W. Holland, C.R. Clayton, and C.W. White, eds., MRS, Pittsburgh, PA, 1984, vol. 27, pp. 151–56.
D.N. Braski, J. Bentley, and J.W. Cable:40th Proc. of Electron Microscopy Soc. Amer., G.W. Bailey, ed., San Francisco Press, San Francisco, CA, 1982, pp. 692–93.
Convergent Beam Electron Diffraction of Alloy Phases, J. Mansfield, ed., Actam Hilger Ltd., Bristol, England, 1984.
M. Tanaka and M. Terauchi:Convergent Beam Electron Dif- fraction, JEOL Ltd., Tokyo, Japan, 1985.
Phase Stability During Irradiation, J.R. Holland, L.K. Mansur, and D.I. Potter, eds., TMS-AIME, Warrendale, PA, 1981.
Effects of Radiation on Materials, Proc. 11th Int. Symp., ASTM STP 782, H.R. Brager and J.S. Perrin, eds., ASTM, Philadel- phia, PA, 1982.
Effects of Radiation on Materials, Proc. 12th Int. Symp., ASTM STP 870, H.R. Brager and J.S. Perrin, eds., ASTM, Philadel- phia, PA, 1985.
E.H. Lee, P.J. Maziasz, and A.F. Rowcliffe:Phase Stability During Irradiation, J.R. Holland, L.K. Mansur, and D.I. Potter, eds., TMS-AIME, Warrendale, PA, 1981, pp. 191–218.
E.A. Kenik:Scripta Metall., 1976, vol. 10, pp. 735–38.
E.H. Lee, A.F. Rowcliffe, and E.A. Kenik:J. Nucl. Mater., 1979, vol. 83, pp. 79–89.
E.A. Kenik:Materials Problem Solving with the Transmission Electron Microscope, MRS Symp. Proc, L.W. Hobbs, K.H. Westmacott, and D.B. Williams, eds., MRS, Pittsburgh, PA, 1986, vol. 62, pp. 209–16.
E.H. Lee and E.A. Kenik:J. Mater. Res., 1988, vol. 3, pp. 840–44.
G.M. Worrall, J.T. Buswell, C.A. English, M.G. Hetherington, and G.D.W. Smith:J. Nucl. Mater., 1987, vol. 148, pp. 107–14.
J.T. Buswell, C.A. English, M.G. Hetherington, W.J. Phythian, G.D.W. Smith, and G.M. Worrall:Effects of Radiation on Materials, Proc. 14th Int. Symp., N.H. Packan and R.E. Stoller, eds., ASTM, Philadelphia, PA, in press.
C.S. Pande, M. Suenaga, B. Vyas, H.S. Isaacs, and D.F. Harlings:Scripta Metall., 1977, vol. 11, pp. 681–84.
E.L. Hall and CL. Briant:Metall. Trans. A, 1984, vol. 15A, pp. 793–811.
Radiation-Induced Sensitisation of Stainless Steels, D.I.R. Norris, ed., Central Electricity Generating Board, Berkeley, England, 1987.
D.I.R. Norris, C. Baker, and J.M. Titchmarsh:Radiation-Induced Sensitisation of Stainless Steels, D.I.R. Norris, ed., Central Elec- tricity Generating Board, Berkeley, England, 1987, pp. 86–98.
T.M. Williams, R.H. Boothby, and J.M. Titchmarsh:Effects of Radiation on Materials, Proc. 14th Int. Symp., N.H. Packan and R.E. Stoller, eds., ASTM, Philadelphia, PA, pp. 116–34.
W. Kesternich, N.H. Packan, and H. Schroeder:Electron Microscopy 1986, Proc. 11th Int. Cong, on Electron Micros- copy, T. Imura, S. Maruse, and T. Suzuki, eds., Japanese So- ciety of Electron Microscopy, Tokyo, Japan,J. Elec. Microsc 1986, vol. 35, pp. 1329–30.
S. Vaidyanatham, T. Lauritzen, and W.L. Bell:Effects of Ra- diation on Materials, Proc. 11th Int. Symp., ASTM STP 782, H.R. Brager and J.S. Perrin, eds., ASTM, Philadelphia, PA, 1982, pp. 619–35.
P.S. Sklad, R.E. Clausing, and E.E. Bloom:Irradiation Effects on the Microstructure and Properties of Metals, Proc. 8th Int. Symp., ASTM STP 611, F.R. Shober and J.A. Sprague, eds., ASTM, Philadelphia, PA, 1985.
P.J. Maziasz and C.J. McHargue:Inter. Mater. Rev., 1987, vol. 32, pp. 190–219.
P.J. Maziasz:MiCon 86: Optimization of Processing, Properties, and Service Performance Through Microstructural Control, B.L. Bramfitt, R.L. Benn, C.R. Brinkman, and G.F. Vander Voort, eds., ASTM STP 979, ASTM, Philadelphia, PA, 1988, pp. 116–61.
P.J. Maziasz and R.W. Swindeman:Advances in Material Technology for Fossil Power Plants, R. Viswanathan and R.I. Jaffee, eds., ASM INTERNATIONAL, Cleveland, OH, 1987, pp. 283–90.
P.J. Maziasz and D.N. Braski:J. Nucl. Mater., 1984, vol. 122, pp. 311–17.
P.J. Maziasz and D.N. Braski:J. Nucl. Mater., 1986, vol. 141- 43, pp. 973–77.
Author information
Authors and Affiliations
Additional information
This paper is based on a presentation made in the symposium “Irradiation-Enhanced Materials Science and Engineering” presented as part of the ASM INTERNATIONAL 75th Anniversary celebration at the 1988 World Materials Congress in Chicago, IL, September 25-29, 1988, under the auspices of the Nuclear Materials Committee of TMS-AIME and ASM-MSD.
Rights and permissions
About this article
Cite this article
Kenik, E.A. Analytical electron microscopy studies of radiation damage. Metall Trans A 20, 2663–2671 (1989). https://doi.org/10.1007/BF02670159
Issue Date:
DOI: https://doi.org/10.1007/BF02670159