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High-resolution electron microscopy analysis of structural defects in a (2/1, 5/3)-type approximant of a decagonal quasicrystal of an AI-Pd-Mn alloy

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Abstract

Structural defects were analyzed by means of high-resolution electron microscopy (HREM) in a crystalline (2/1, 5/3)-type Fibonacci approximant of an Al-Pd-Mn alloy system. A kind of stacking fault is observed with a projected displacement vectorR parallel to the [-3 0 29] direction; its amplitude |R| =2a sin 18 deg = 1.19 nm, and its habit plane lies in the (1 0 1) plane. Two kinds of domain boundaries have been found and the domains are related by a 180 deg rotation around thec-axis plus a displacement along the [3 0 -29] or the [-3 0 -29] direction in a plane perpendicular to theb-axis. The domain boundary planes are the {101} planes.

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Authors and Affiliations

  1. Dept. of Phys., Peking University, 100871, Beijing, People’s Republic of China

    D. P. Yu

  2. Beijing Laboratory of Electron Microscopy, Chinese Academy of Sciences, 100 080, Beijing, People’s Republic of China

    G. Ren (Postdoctoral Student) & Z. Zhang (Professor and Director)

Authors
  1. D. P. Yu
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  2. G. Ren
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  3. Z. Zhang
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formerly Post-doctorate Researcher with Beijing Laboratory of Electron Microscopy, Chinese Academy of Sciences, Beijing, China

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Yu, D.P., Ren, G. & Zhang, Z. High-resolution electron microscopy analysis of structural defects in a (2/1, 5/3)-type approximant of a decagonal quasicrystal of an AI-Pd-Mn alloy. Metall Mater Trans A 27, 2911–2915 (1996). https://doi.org/10.1007/BF02663840

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  • DOI: https://doi.org/10.1007/BF02663840

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