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X-Ray diffraction line profile analysis on the microstructure of cold-worked face-centered cubic Cu-Ge-Si alloys: Effects of dilute solutes Si and GE

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Authors and Affiliations

  1. Department of Materials Science, Indian Association for the Cultivation of Science, 700032, Jadavpur, Calcutta, India

    S. K. Pradhan (Senior Research Fellow) & M. De (Senior Lecturer)

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  1. S. K. Pradhan
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  2. M. De
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Pradhan, S.K., De, M. X-Ray diffraction line profile analysis on the microstructure of cold-worked face-centered cubic Cu-Ge-Si alloys: Effects of dilute solutes Si and GE. Metall Trans A 20, 1883–1885 (1989). https://doi.org/10.1007/BF02663219

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  • DOI: https://doi.org/10.1007/BF02663219

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