Abstract
The aspect ratio (joint area/joint thickness) of thin (0.001-0.006 in.) surface mount solder (60S-40Pb) joints plays an important role in determining the mechanical properties and fracture behavior of the joints. This study demon-strates that plastic constraint of a large aspect ratio 60Sn-40Pb solder joint can develop triaxial (hydrostatic) stresses several times greater than the average tensile strength of the bulk solder material. A four to sixfold increase in average joint stress and up to a tenfold increase in peak stress was measured on joints with aspect ratios ranging from 400 to 1000. Although a direct relationship of the aspect ratio to the average tensile stress is shown, as the Friction Hill model predicts, the observed stress increase is not nearly as high but proportional to the classical prediction. This is attributed to the existence of internal defects (oxide particles and micro-voids) and transverse grain boundaries which fail producing internal free surfaces. Thus, the actual aspect ratio is thickness/d2, where d equals the distance between internal surfaces. The fracture of these constrained joints was brittle, with the separation occurring between a tin-rich copper tin intermetallic at the interface and the solder matrix. Voids within the solder joint are shown to relieve the plastic constraint and lower the average tensile stress of the joint. The Friction Hill model may play an important role in explaining the small percentage of atypical solder joint failures which sometimes occur on electronic assemblies. In particular, the sudden failure of a thin joint in a strain controlled environment may be attributed to the development of a large hydrostatic stress component. Therefore, a flaw free, plastically constrained joint which develops a high stress state will be a high risk candidate for failure.
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Ranieri, J.P., Lauten, F.S. & Avery, D.H. Plastic constraint of large aspect ratio solder joints. J. Electron. Mater. 24, 1419–1423 (1995). https://doi.org/10.1007/BF02655458
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DOI: https://doi.org/10.1007/BF02655458