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Infrared reflectance and absorption of N-type InP

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Abstract

It has been shown that measurement of the infrared reflectance minimum frequency offers a simple, non-destructive method to determine carrier densities of n-type InP. Free carrier absorption has been measured for InP with carrier densities of 0.4-9 × l018/cm3 in the spectral range of 1.1-l0μm and discussed in terms of optical phonon scattering and impurity scattering. In particular, the absorption at λ= 1.3μm should be considered in the design of long wavelength photodetectors and light emitting diodes to improve external quantum efficiencies.

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References

  1. Y. Seki, J. Matsui and H. Watanabe, J. Appl. Phys.47, 3374 (1976).

    Article  CAS  Google Scholar 

  2. R. T. Holm, J. W. Gibson, and E. D. Palik, J. Appl. Phys.48, 212 (1977).

    Article  CAS  Google Scholar 

  3. O. K. Kim and W. G. Spitzer, Phys. Rev.20, 3258 (1979).

    Article  CAS  Google Scholar 

  4. K. Okada and T. Oku, Jpn. J. Appl. Phys.6, 276 (1967).

    Article  CAS  Google Scholar 

  5. R. Newman, Phys. Rev.111, 1518 (1958).

    Article  CAS  Google Scholar 

  6. W. P. Dumke, M. R. Lorenz, and G. D. Pettit, Phys. Rev.B1, 4668 (1970).

    Google Scholar 

  7. W. Walukiewicz, J. Lagowski, L. Jastrzebski, P. Rava, M. Lichtensteiger, C. H. Gatos, and H. C. Gatos, J. Appl. Phys.51, 2659 (1980).

    Article  CAS  Google Scholar 

  8. M. Yamaguchi, A. Yamamoto, S. Shinoyama, and H. Sugiura, J. Appl. Phys.53, 633 (1981).

    Article  Google Scholar 

  9. A. A. Ballman, A. M. Glass, R. E. Nahory, and H. Brown, J. Cryst. Growth, to be published.

  10. S. Yamakoshi, M. Abe, O. Wada, S. Komiya, and T. Sakurai, IEEE J. Quantum. Electron,17, 167 (1981); A. K. Chin, C. L. Zipfel, B. V. Dutt, M. H. DiGiuseppe, K. B. Baners and D. D. Roccasecca, Jpn. J. Appl. Phys.20, 1487 (1981).

    Article  Google Scholar 

  11. T. P. Lee, C. A. Burrus, Jr., and A. G. Dentai, IEEE J. Quantum. Electron.17, 232 (1981); S. R. Forrest, I. Camlibel, O. K. Kim, and J. R. Zuber, IEEE Electron Device Letts.EDL-2, 283 (1981).

    Article  Google Scholar 

  12. G. Lucovsky, M. H. Brodsky, M. F. Chen, R. J. Chicotka, and A. T. Ward, Phys. Rev.B4, 1945 (1971).

    Google Scholar 

  13. R. J. Nicholas, S. J. Sessions, and J. C. Portal, Appl. Phys. Lett.37, 178 (1980).

    Article  CAS  Google Scholar 

  14. W. G. Spitzer and J. M. Whelan, Phys. Rev.114, 59 (1959).

    Article  CAS  Google Scholar 

  15. B. O. Seraphin and H. E. Bennett, inSemiconductors and Semimetals, Vol. 3, edited by R. K. Willardson and A. C. Beer, (Academic Press, New York, 1967).

    Google Scholar 

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Authors and Affiliations

  1. Bell Laboratories, 07974, Murray Hill, New Jersey

    O. K. Kim & W. A. Bonner

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  1. O. K. Kim
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  2. W. A. Bonner
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Kim, O.K., Bonner, W.A. Infrared reflectance and absorption of N-type InP. J. Electron. Mater. 12, 827–836 (1983). https://doi.org/10.1007/BF02655296

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