Abstract
In experiments employing a conventional low-pressure, rotating-disk organome-tallic vapor phase epitaxy reactor, GaAs epilayers have been grown at substrate temperatures ranging from 425 to 500°C by exposing the substrate alternately to trimethylgallium (TMG) and AsH3.The GaAs growth rateR was approximately constant with TMG flow rate, but with increasing TMG injection timet, it increased to more than one monolayer per TMG/AsH3 cycle without saturating. Although growth was not self-limiting, for one specific combination of temperature andt, a value of R = 1 monolayer/cycle could be achieved by usingt values decreasing from 10.8 s at 425°C to 0.9 s at 500°C in accordance with an Arrhenius relationship between 1/t and absolute temperature.
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Wang, C.A., Tracy, D.M. Adjusting trimethylgallium injection time to explore atomic layer epitaxy of GaAs between 425 and 500°C by organometallic vapor phase epitaxy. J. Electron. Mater. 23, 185–189 (1994). https://doi.org/10.1007/BF02655267
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DOI: https://doi.org/10.1007/BF02655267