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Circuit related issues due to radiation in hostile environments

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Abstract

Various types of radiation in hostile environments cause transient and permanent changes in the devices used in complex integrated circuits. The failure of a particular IC is a function not only of the basic material and device parameter changes but also of the circuit environment in which the device is located. Circuit techniques have been developed which minimize the detrimental effects of radiation on certain types of circuits. In other cases, circuit techniques are not very effective in minimizing radiation effects. This work discusses selected issues related to the interactions between device radiation effects and circuit performance or circuit failure in a hostile radiation environment. This is not meant to be a comprehensive study of circuit effects but rather several examples are selected to illustrate the issues involved in designing circuits to operate in hostile radiation environments.

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Author notes

  1. J. R. Hauser & S. E. Kerns

    Present address: Department of Electrical Engineering, Vanderbilt University, 27235, Nashville, Tennessee

Authors and Affiliations

  1. Electrical and Computer Engineering Department, North Carolina State University, 27695-7911, Raleigh, North Carolina

    J. R. Hauser & S. E. Kerns

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  1. J. R. Hauser
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Hauser, J.R., Kerns, S.E. Circuit related issues due to radiation in hostile environments. J. Electron. Mater. 19, 671–688 (1990). https://doi.org/10.1007/BF02655236

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  • DOI: https://doi.org/10.1007/BF02655236

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