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Nondestructive characterization of Hg1−xCdxTe layers with n-p structures by magneto-thermoelectric measurements

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Abstract

The thermoelectric properties of n-type Hg0.79Cd0.21Te (MCT) and of MCT layers with n-p structure have been investigated in transverse (B ⊥ ∇T) and longitudinal (B ‖∇T) magnetic fields (0 ≤ B ≤ 16 kG) using the lateral gradient method at temperatures between 10 and 300K. The experimental results were analyzed by considering the contributions of electrons and holes to the magneto-thermoelectric effect and the scattering mechanisms involved. The analysis is based on a nonparabolic conduction band and Landau quantization as well as empirical relations for the band gap, the intrinsic carrier density, and the magnetoresistance. For n-type MCT at low temperatures (10 < T < 30K) and weak magnetic fields (B < 2 kG), the transverse magneto-thermoelectric effect (TME) was seen to be dominated by electron scattering on ionized defects. Longitudinal acoustic phonon drag was found to affect the TME in strong magnetic fields (B > 3 kG) at low temperatures (T < 20K). Longitudinal (LO) phonons were shown to prevail in the electron scattering at higher temperatures (T > 50K) in weak magnetic fields. With increasing magnetic fields, the effect of LO-phonon scattering decreases, and eventually the TME becomes independent of electron scattering. The longitudinal magneto-thermoelectric effect of n-type MCT was also found to exhibit magnetophonon oscillations due to LO-phonon scattering from both HgTe and CdTe phonons. The transverse magnetoresistance (TMR) of the n-type layers in the quantum region has been found to be linearly dependent on the magnetic field. Owing to the TMR of the n-type layers, the variation of the TME of p-n multiple layers with magnetic field is much larger than the variation of the Seebeck coefficient with temperature. Thus, the sensitivity to p-type layers is considerably enhanced compared to that of the Seebeck coefficient. As a result, the TME has proved to be particularly useful in determining the doping and composition of the constituent layers of MCT n-p structures.

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Author notes

  1. C. L. Littler

    Present address: Department of Physics, University of North Texas, 76203, Denton, TX

Authors and Affiliations

  1. Fraunhofer-Institut für Angewandte Festkörperphysik, Tullastrasse 72, D-79108, Freiburg i, Br., Germany

    J. Baars, D. Brink, C. L. Littler & M. Bruder

  2. AEG-Aktiengesellschaft, INFRAROTMODULE, D-74072, Heilbronn, Germany

    M. Bruder

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  1. J. Baars
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  2. D. Brink
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  3. C. L. Littler
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  4. M. Bruder
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Baars, J., Brink, D., Littler, C.L. et al. Nondestructive characterization of Hg1−xCdxTe layers with n-p structures by magneto-thermoelectric measurements. J. Electron. Mater. 24, 1311–1319 (1995). https://doi.org/10.1007/BF02653090

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  • DOI: https://doi.org/10.1007/BF02653090

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