Abstract
We report the results of the transport properties and the recombination mechanisms of indium-doped HgCdTe(211)B (x ≈ 23.0% ± 2.0%) layers grown by molecular beam epitaxy. We have investigated the origin(s) of the background doping limitation in these layers. Molecular beam epitaxially grown layers exhibit excellent Hall characteristics down to indium levels of 2 x 1015 cm−3. Electron mobilities ranging from (2-3) x 105 cm2/v-s at 23K were obtained. Measured lifetime data fits very well with the intrinsic band-to-band recombinations. However, below 2 x 1015 cm−3 doping levels, mobility vs temperature curves starts to reflect nonuniformity in carrier distribution. Also, when we reduced the Hg vacancy concentration down to 1012 cm−3 range, by annealing at 150°C, Hall characteristics shows an increase in the nonuniformity in the epilayers. It was found that after annealed at 150°C, the obtained SR defect level has a different origin than the previously obtain Hg-vacancy related defect level.
Similar content being viewed by others
References
J.P. Faurie, S. Sivananthan and P.S. Wijewarnasuriya,SPIE Proc. 1735, 141 (1992).
T.H. Myers, K.A. Harris, R.W. Yanks, C.M. Mohnkan, R.J. Williams and E.K. Dudoff,J. Vac. Sci. Technol. B 10, 1438 (1992).
P. Rudolph, M. Muhlberg, M. Neubert, T. Boeck, P. Mack, L. Parthier and K. Jacobs.J. Cryst. Growth 118, 202 (1992).
P.S. Wijewarnasuriya, M.D. Lange, S. Sivananthan and J.P. Faurie,J. Appl. Phys. 75, 1005 (1994).
P.S. Wijewarnasuriya, M.D. Lange, S. Sivananthan and J.P. Faurie,J. Eletron. Mater. 24, 545 (1995).
L.J. van der Pauw,Philips Tech. Rev. 20, 220 (1958).
M.A. Kinch, M.J. Brau and A. Simmons,J. Appl. Phys. 44, 1649(1973).
L.F. Lou and W.H. Frye,J. Appl. Phys. 56, 2253 (1984).
M.A. Kinch and S.R. Borrello,Infrared Phys. 15,111(1975).
J.J. Dubowski, T. Dietl, W. Szymanska and R.R. Galazka,J. Phys. Chem. Solids 42, 351 (1981).
D. Long,Phys. Rev. 176, 923 (1968).
R. Finkman,J. Appl. Phys. 54, 1883 (1983).
J.R. Meyer, C.A. Hoffman, F.J. Bartoli, D.A. Arnold, S. Sivananthan and J.P. Faurie,Semicond. Sci. Technol. 8, 805 (1993).
M.B. Reine, K.R. Maschhoff, S.P. Tobin, P.W. Norton, J.A. Mroczkowski and E.E. Krueger,Semicond. Sci. Technol. 8, 788 (1993).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Wijewarnasuriya, P.S., Langer, M.D., Sivananthan, S. et al. Analysis of low doping limitation in molecular beam epitaxially grown HgCdTe(211)B epitaxial layers. J. Electron. Mater. 24, 1211–1218 (1995). https://doi.org/10.1007/BF02653076
Received:
Revised:
Issue Date:
DOI: https://doi.org/10.1007/BF02653076