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A high-resolution transmission electron microscopy study of interfaces between the γ, B2, and α2 phases in a Ti-Al-Mo alloy

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Abstract

Conventional and high-resolution transmission electron microscopy (HRTEM) were used to examine the interfacial structures in a Ti-50Al-5Mo (at. pct) alloy which was processed to produce combinations of γ, B2, and α2 phases in a single sample. A small amount of a fourth phase labeled ζ was also found in the microstructure. It may be the phase Ti2AlN but confirmation requires analysis of the N content in the phase.In this alloy, the orientation relationship between the γ and B2 phases is {111}γ ∥}110}B2 and 〈101]γ ∥ 〈111〉B2 with a coherent habit-plane interface parallel to (474)γ. The orientation relationship between the B2 and α2 (and also the ζ@#@) phases is {110}B2 ∥(0001)α2/ζ and 〈111〉B2 ∥〈11-20〉α2/ζ with a coherent interface parallel to the close-packed planes and along other orientations. The orientation relationship between the α2 (and also the ζ@#@) and γ phases is (0001)α2/ζ ∥{lll}γ and (11•20)α2/ζ ∥<10•1]γ. The α2 phase has a coherent interface parallel to the close-packed planes, while the ζ phase appears to adopt the (474)γ interface plane of the γ phase, similar to the B2 phase. In some cases, the interface configuration between the γ and B2 phases appears to be altered by the presence of α2 phase, resulting in a semicoherent interface. The phase labeled ζ in this study has the same orientation relationship with the γ and B2 phases as α2 but consists of an ABABAC... stacking of close-packed basal planes. The (474)γ habit plane interface between the γ and B2 phases is analyzed by several different theories of interfacial structure, and microstructural evolution in this system is also discussed.

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Authors and Affiliations

  1. Department of Metallurgical Engineering, Jadavpur University, 700 032, Calcutta, India

    S. Das

  2. Department of Materials Science and Engineering, University of Virginia, 22903-2442, Charlottesville, VA

    J. M. Howe (Professor)

  3. Department of Materials Science and Engineering, University of Wisconsin-Madison, 53706-1595, Madison, WI

    J. H. Perepezko (Professor)

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  3. J. H. Perepezko
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Formerly a Postdoctoral Fellow with the University of Wisconsin-Madison, is now with the

This article is based on a presentation made during TMS/ASM Materials Week in the symposium entitled “Atomistic Mechanisms of Nucleation and Growth in Solids,” organized in honor of H.I. Aaronson’s 70th Anniversary and given October 3–5, 1994, in Rosemont, Illinois.

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Das, S., Howe, J.M. & Perepezko, J.H. A high-resolution transmission electron microscopy study of interfaces between the γ, B2, and α2 phases in a Ti-Al-Mo alloy. Metall Mater Trans A 27, 1623–1634 (1996). https://doi.org/10.1007/BF02649820

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