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Topography and angular distribution of sputtered atoms of silver target bombarded by Si n − (n =1, 2) ions

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Academia Sinica, Institute of Nuclear Research, PO Box 800-204, 201800, Shanghai, People's Republic of China

    Wang Zhenxia, Pan Jisheng, Zhang Jiping, Tao Zhenlan & Du Guangtian

  2. Applied Radiation Institute, Shanghai University of Science and Technology, 201800, Shanghai, People's Republic of China

    Wang Chuanshan, Li Xinnian, Xie Yifen, Luo Wenyun & Zhou Shuxin

Authors
  1. Wang Zhenxia
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  2. Pan Jisheng
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  3. Zhang Jiping
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  4. Tao Zhenlan
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  5. Du Guangtian
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  6. Wang Chuanshan
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  7. Li Xinnian
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  8. Xie Yifen
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  9. Luo Wenyun
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  10. Zhou Shuxin
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Zhenxia, W., Jisheng, P., Jiping, Z. et al. Topography and angular distribution of sputtered atoms of silver target bombarded by Si n − (n =1, 2) ions. J Mater Sci Lett 14, 33–34 (1995). https://doi.org/10.1007/BF02565278

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  • DOI: https://doi.org/10.1007/BF02565278

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