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Kobayashi, K. OH-related capacitance-voltage recovery effect in MOS capacitors passivated by PbO-B2O3-SiO2-GeO2 glasses Part V The effects of B2O3 content. J Mater Sci Lett 14, 6–8 (1995). https://doi.org/10.1007/BF02565268
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DOI: https://doi.org/10.1007/BF02565268