Detection limit in the (pX, X) technique—A novel method for trace element analysis
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The (pX, X) technique is a very reliable tool for trace element analysis when large amounts of a neighboring element are present. This paper describes the experimentally determined detection limits of some available sources of GaAs, Ge and Zr, to evaluate the utility of this technique. The theoretical detection limits calculated with a computer program are also described.
KeywordsGaAs Proton Beam Trace Element Analysis Neighboring Element Backing Material
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