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Journal of Radioanalytical Chemistry

, Volume 76, Issue 1, pp 139–149 | Cite as

Detection limit in the (pX, X) technique—A novel method for trace element analysis

  • K. Jinno
  • K. Kawasaki
  • M. Sato
  • S. Amemiya
  • T. Katoh
Physical Methods Section

Abstract

The (pX, X) technique is a very reliable tool for trace element analysis when large amounts of a neighboring element are present. This paper describes the experimentally determined detection limits of some available sources of GaAs, Ge and Zr, to evaluate the utility of this technique. The theoretical detection limits calculated with a computer program are also described.

Keywords

GaAs Proton Beam Trace Element Analysis Neighboring Element Backing Material 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Akadémiai Kiadó 1983

Authors and Affiliations

  • K. Jinno
    • 1
  • K. Kawasaki
    • 1
  • M. Sato
    • 1
  • S. Amemiya
    • 2
  • T. Katoh
    • 2
  1. 1.School of Materials ScienceToyohashi University of TechnologyToyohashiJapan
  2. 2.Faculty of EngineeringNagoya UniversityNagoyaJapan

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