Abstract
The effect of source-sample-detector geometry on the analytical sensitivity of Si(Li) detector X-ray spectrometer was investigated. The theoretically calculated and experimentally determined sensitivity values are in good agreement in case of a matrix having average atomic number of Z=10.
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Kis-Varga, M., Bacsó, J. Investigations for determining the optimum measurement geometry of Si(Li) detector X-ray spectrometer. J. Radioanal. Chem. 31, 407–412 (1976). https://doi.org/10.1007/BF02518506
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DOI: https://doi.org/10.1007/BF02518506