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Trace determination of boron, silicon and sulfur with oxygen-18 ion bombardment

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Abstract

In order to determine traces of boron, silicon and sulfur, B(18O, x)27Mg, Si(18O, x)43Sc and S(18O, x)47V reactions have been investigated between 15 and 44MeV. At 34 MeV, only a few of the systematically identified nuclear interferences produce27Mg and the detection limit is 30ng boron for a 10 minute irradiation with a 0.3μA·cm−2 oxygen-18 beam. Silicon analysis has shown nuclear interferences from Al, P and K; interference-free detection limit is 80 ng silicon for an hour irradiation with a 0.4 μA·cm−2 beam at 39 MeV. There is no nuclear interference for the sulfur determination and the detection limit is 5 ng sulfur for a 30 minutes irradiation with a 0.5 μA·cm−2 beam at 39 MeV. Thus a selective and sensitive sulfur determination can be achieved.

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Authors and Affiliations

  1. Institut d’électrochimie et de radiochimie, Swiss Federal Institute of Technology, CH-1015, Lausanne, Switzerland

    C. Friedli, M. Rousseau & P. Lerch

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  1. C. Friedli
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  2. M. Rousseau
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  3. P. Lerch
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Friedli, C., Rousseau, M. & Lerch, P. Trace determination of boron, silicon and sulfur with oxygen-18 ion bombardment. J. Radioanal. Chem. 64, 239–247 (1981). https://doi.org/10.1007/BF02518354

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  • DOI: https://doi.org/10.1007/BF02518354

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