Abstract
Detection of small quantities of uranium in silicon wafers has been carried out by neutron activation followed by observation of fission product140La. Irradiations of about one week were made at a flux of 6·1014n cm−2 s−1 and the activity of the 1596 keV line was determined. Counting rates of as low as 1 count per minute have been observed. This indicates uranium concentrations of about 5·1010 atoms per cubic centimeter of silicon or about 0.01 mg/g, assuming activity from other fissionable nuclides to be negligible.
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James, W.D., Thompson, C.E. Search for uranium in high purity silicon. J. Radioanal. Chem. 72, 79–88 (1982). https://doi.org/10.1007/BF02516776
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DOI: https://doi.org/10.1007/BF02516776