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Formation of a lateral-shear interference pattern in two-exposure recording of a fourier speckle pattern with a negative lens

  • Optics and Spectroscopy
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Russian Physics Journal Aims and scope

Abstract

The formation of a lateral-shear speckle interference pattern in bands of infinite width in two-exposure recording of the Fourier speckle pattern of a ground-glass screen by a negative lens is analyzed. It is demonstrated theoretically and experimentally that an interference pattern is localized in the Fourier plane during reconstruction; that patterns is characterized by axial wave aberrations of the lens and optical system used in the channel illuminating the ground-glass screen, with twice the sensitivity for a fixed lateral shear. In the particular case when the lens is in the plane of the ground glass screen the interference pattern characterizes the axisymmetric wave front aberrations.

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References

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Authors
  1. V. G. Gusev
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Additional information

Tomsk State University. Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 7, p. 72–78, July, 1997.

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Gusev, V.G. Formation of a lateral-shear interference pattern in two-exposure recording of a fourier speckle pattern with a negative lens. Russ Phys J 40, 659–663 (1997). https://doi.org/10.1007/BF02514956

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  • DOI: https://doi.org/10.1007/BF02514956

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