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Journal of Radioanalytical Chemistry

, Volume 55, Issue 2, pp 407–415 | Cite as

The study of fundamental aspects of charged particle activation analysis

  • G. Blondiaux
  • A. Giovagnoli
  • K. Ishii
  • C. Koemmerer
  • M. Valladon
  • J. -L. Debrun
Physical Methods Section

Abstract

Two important problems are discussed: equations and data used for quantitation on one hand, diffusion under irradiation on another hand. It is suggested that recent semiempirical stopping power data for hydrogen and helium are sufficiently accurate to be used in any good calibration method, while for heavier ions it is preferable to use the “double reaction method”, which avoids the use of stopping power data. The problem of the additivity of the stopping powers in the case of compounds is also discussed and it is shown in a specific case that BRAGG-KLEEMAN's rule is valid. Deep diffusion under irradiation has sometimes been mentioned (e.g. F in Ge, Cu in Si): it can be an important source of errors in trace analysis. The possible deep diffusion of F in Ge has been studied: it is shown that such a diffusion does not occur, while surface contamination problems can lead to erroneous observations.

Keywords

Fundamental Aspect Trace Analysis Beam Density Charge Particle Activation Analysis Thick Target Yield 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Akadémiai Kiadó 1980

Authors and Affiliations

  • G. Blondiaux
    • 1
  • A. Giovagnoli
    • 1
  • K. Ishii
    • 1
  • C. Koemmerer
    • 1
  • M. Valladon
    • 1
  • J. -L. Debrun
    • 1
  1. 1.Groupe Application des Réactions Nucléaires à l'Analyse ChimiqueC.N.R.S.Orléans Cedex(France)

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