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Radiochemical study of deposition of tracer phosphate ions on certain ignited microcyystalline fluorides

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Abstract

Deposition of carrier-free32P on ignited PbF2, BaF2, SrF2, CaF2 and MgF2 is described as a function of the pH and the concentration of added lattice and non-lattice ions. The influence of these factors in enhancing the carrying is explained. The carrying is explained in the light of surface adsorption taking place by the mechanism of counter-ion exchange. In contrast with expectations, the carrying is favoured in the presence of non-lattice cations (e. g. Ba2+ and Sr2+) having the same electric charge and comparable ionic radii. These observations are discussed in the light of findings made in the case of lead sulphate, where the carrying of the same tracer is adversely affected by the presence of these foreign cations. The structural characteristics which are assumed to be responsible for the anchoring of these non-lattice cations by the lattice anion on the lead sulphate surface are supposed not to exist in these cases.

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  1. Department of Chemistry, Indian Institute of Technology, Hauz Khas, 110029, New Delhi, (India)

    M. M. Bhutani

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  1. M. M. Bhutani
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Bhutani, M.M. Radiochemical study of deposition of tracer phosphate ions on certain ignited microcyystalline fluorides. J. Radioanal. Chem. 23, 89–99 (1974). https://doi.org/10.1007/BF02514348

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  • DOI: https://doi.org/10.1007/BF02514348

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