Journal of Radioanalytical Chemistry

, Volume 16, Issue 2, pp 567–586 | Cite as

Complementary use of microanalysis by the direct observation of nuclear reactions and of backscattering induced by charged particles

  • F. Abel
  • G. Amsel
  • E. d'Artemare
  • M. Bruneaux
  • C. Cohen
  • B. Maurel
  • C. Ortega
  • S. Rigo
  • J. Siejka
  • M. Croset
  • D. Dieumegard
Analysis by Direct Observation of Nuclear Reactions

Abstract

Techniques are described which combine the use of nuclear reactions and of backscattering to obtain analytical results which would be difficult or impossible to reach using one of these methods only. The principles of stoichiometry determination by plateau height analysis are developed both for backscattering and for narrow resonances of nuclear reactions. Examples of applications are given to the determination of the composition of various thin films of aluminium and silicon oxides, silicon nitrides and calcium fluorides. The analysis of samples smaller than the beam, using backscattered particle monitoring, is presented.

Keywords

Nuclear Reaction Narrow Resonance Calcium Fluoride Anodic Oxide Film Excitation Curve 

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Copyright information

© Akadémiai Kiadó 1973

Authors and Affiliations

  • F. Abel
    • 1
  • G. Amsel
    • 1
  • E. d'Artemare
    • 1
  • M. Bruneaux
    • 1
  • C. Cohen
    • 1
  • B. Maurel
    • 1
  • C. Ortega
    • 1
  • S. Rigo
    • 1
  • J. Siejka
    • 1
  • M. Croset
    • 2
  • D. Dieumegard
    • 2
  1. 1.Groupe de Physique des Solides de l'Ecole Normale SupérieureParis(France)
  2. 2.Laboratoire CentralThomson-C. S. F.Orsay(France)

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