Abstract
It is shown theoretically and experimentally that on reproduction of a two-exposure record of a focused groundglass-image specklegram, a lateral-shift interferogram formed in the far diffraction zone in bands of infinite width characterizes the axial wave aberrations of the lens with which the record was made. The interferometer has twice the sensitivity at a given lateral shift, and the form of the interference pattern does not depend on the off-axis wave aberrations of the lens.
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References
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Additional information
Tomsk State University. Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 3, pp. 14–20, March, 1997.
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Gusev, V.G. Laternal-shift interferogram formation on two-exposure recording of a focused-image specklegram. Russ Phys J 40, 226–230 (1997). https://doi.org/10.1007/BF02510820
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DOI: https://doi.org/10.1007/BF02510820