Abstract
The precision of the transfer of the dimension of the unit of length is reduced because the process of transferring the unit is multi-step in nature. A concept of the metrological support of linear measurements that depends on wavelength standards of length is proposed. A projected accuracy chart that implements this concept is proposed.
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References
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Additional information
Ukraine. Translated from Izmeritel'naya Tekhnika, No. 6, pp. 30–33, June, 1999.
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Pushkarev, G.P. Metrological support of linear measurements in the range 0.001–100,000 m. Meas Tech 42, 555–558 (1999). https://doi.org/10.1007/BF02504412
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DOI: https://doi.org/10.1007/BF02504412