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Measurement Techniques

, Volume 41, Issue 4, pp 383–388 | Cite as

Scanning tunneling microscope—A nanoelectronic measuring instrument

  • S. A. Bychikhin
  • M. O. Gallyamov
  • V. V. Potemkin
  • A. V. Stepanov
  • I. V. Yaminskii
Electronic Measurements
  • 36 Downloads

Abstract

The advantages of using the scanning tunneling microscope for accurate measurements when solving problems in nanotechnology are considered. The results of noise measurements made using the scanning tunneling microscope are presented and it is shown that the fundamental limination on the spatial resolution along the normal to the surface of the sample being investigated is due to low-frequency fluctuations of the tunnel current. The limit sensitivity of the microscope is determined.

Keywords

Scanning Tunneling Microscope Tunnel Junction Tunnel Current Scan Tunneling Microscope Image Feedback Circuit 
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Copyright information

© Plenum Publishing Corporation 1998

Authors and Affiliations

  • S. A. Bychikhin
  • M. O. Gallyamov
  • V. V. Potemkin
  • A. V. Stepanov
  • I. V. Yaminskii

There are no affiliations available

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