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Measurement Techniques

, Volume 41, Issue 4, pp 361–365 | Cite as

Metrological support for the electromagnetic method of conductivity measurement

  • É. I. Illarinov
  • N. M. Naumov
  • A. M. Rivlin
Electromagnetic Measurements
  • 13 Downloads

Abstract

The development of standard samples of conductivity for measurements in the range from 37.7 to 59.4 MS is described. The samples are used as metrological support to ensure accuracy and uniformity of conductivity measurements by the (electromagnetic) eddy-current method.

Keywords

Standard Sample Copper Alloy Nondestructive Test Silicon Content Voltage Compensator 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Publishing Corporation 1998

Authors and Affiliations

  • É. I. Illarinov
  • N. M. Naumov
  • A. M. Rivlin

There are no affiliations available

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