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Calculation of energy dissipation and temperature rise of piezoelectric metal-insulator-metal structures

  • Acoustical Measurements
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Measurement Techniques Aims and scope

Abstract

Equations are given for calculating the temperature rise of thin-film piezoelectric transducers as a result of dielectric, mechanical, and piezoelectric losses and currents in the presence of electrostatic and harmonic excitation. The results of the article can be used in the design of optoelectronic and acoustic measuring devices.

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Authors
  1. V. M. Bogomol'nyi
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 12, pp. 47–50, December, 1998.

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Bogomol'nyi, V.M. Calculation of energy dissipation and temperature rise of piezoelectric metal-insulator-metal structures. Meas Tech 41, 1162–1166 (1998). https://doi.org/10.1007/BF02503839

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