Abstract
Methods for measurement of atomic-fluorescence signals that allow for the effect of scattered radiation are considered. The proposed methods are based on broadening of the emission line of the spectrometer lamp.
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References
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Additional information
Translated from Izmeritel'naya Tekhnika, No. 7, pp. 31–33, July, 2000.
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Rukin, E.M. Increasing measurement quality by atomic fluorescence analysis. Meas Tech 43, 598–601 (2000). https://doi.org/10.1007/BF02503595
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DOI: https://doi.org/10.1007/BF02503595