Skip to main content
Log in

Application of thermal-wave electron microscopy to imaging and assessment of corrosion on rough steel surface

  • Experimental Methods and Devices
  • Published:
Materials and Structures Aims and scope Submit manuscript

Abstract

Thermal-wave electron microscopy, which employs heat flow to probe variations in the thermal properties of solid materials, can provide micrometre-level resolution of surface and subsurface features of opaque samples. The effects of modulation frequency, phase detection and surface characteristics on the contrast and resolution of thermal-wave electron images of corrosion products on unprotected steel surfaces were investigated. Thermal-wave electron imaging is shown to be capable of distinguishing between the corrosion products and surface topographic features of the sample. This allows an automated image analysis technique to be used to assess quantitatively the extent of corrosion on rough steel surfaces.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. Bennett, L. H. et al., ‘Economic Effects of Metallic Corrosion in the United States,’ NBS Special Publication 511-1 (National Bureau of Standards, Washington, DC, 1978).

    Google Scholar 

  2. Nguyen, T. and Rosencwaig, A., ‘Thermal-wave microscopy and its application to imaging the microstructure and corrosion of cold-rolled steel,’Appl. Surf. Sci. 24 (1985), 57–74.

    Article  Google Scholar 

  3. Nguyen, T., ‘Thermal-wave imaging of the microstructure and corrosion of cold-rolled steel under protective coatings,’Ind. Eng. Chem. Res. Dev. 24 (1985), 496–500.

    Article  Google Scholar 

  4. Nguyen, T. and McKnight, M. E., ‘Nondestructive early detection of corrosion and delamination under protective coatings using thermal-wave microscopy,’ in Internal Report NBSIR 85-3187 (National Bureau of Standards, Washington, DC, 1985) pp. 139–150.

    Google Scholar 

  5. Rosencwaig, A., ‘Photoacoustics and Photoacoustic Spectroscopy’ (Wiley, New York, 1980).

    Google Scholar 

  6. Gargill III, G. S., ‘Electron-acoustic microscopy,’Phys. Today 34 (1981), 27–32.

    Article  Google Scholar 

  7. Rosencwaig, A., ‘Thermal-wave imaging and microscopy,’ in ‘Scanned Image Analysis’, edited by E. Ash (Academic, New York, 1980) pp. 292–315.

    Google Scholar 

  8. Opsal, J. and Rosencwaig, A., ‘Thermal-wave depth profiling-theory,’J. Appl. Phys. 53 (1982), 4240–4246.

    Article  Google Scholar 

  9. Brandis, E. and Rosencwaig, A., ‘Thermal-wave microscopy with electron beams,’37 (1980), 98–100.

    Google Scholar 

  10. Rosencwaig, A., ‘Thermal-wave imaging,’Science 218 (1982), 223–228.

    Google Scholar 

  11. Kirkbright, G. F., Miller, R. M. and Rzadkiewicz, A., ‘A lower-cost laboratory thermal wave imaging system,’J. Phys. E.: Sci. Instrum. 17 (1984), 526–531.

    Article  Google Scholar 

  12. Technical Report No. 83.01 (Therma-Wave Inc., Fremont, California, 1983).

  13. Rosencwaig, A., ‘Thermal-wave microscopy,’Solid State Technol. 25 (1982) pp. 91–96.

    Article  Google Scholar 

  14. Technical Report No. 84.01 (Therma-Wave Inc., Fremont, California, 1984).

  15. Kirkbright, G. F. and Miller, R. M., ‘Thermal-wave imaging of optically thin films utilizing the photoacoustic effect,’Analyst 10 (1982), 798–802.

    Article  Google Scholar 

  16. Rosencwaig, A., Opsal, J. and Willenborg, D., ‘Thin-film thickness measurement with thermal waves,’Appl. Phys. Lett. 43 (1983), 166–168.

    Article  Google Scholar 

  17. Rosencwaig, A., ‘Depth profiling of integrated circuits with thermal-wave electron microscopy,’Electronics Lett. 16 (1980), 28–31.

    Google Scholar 

  18. Blau, P. J. and Olson, C. D., ‘An application of thermal-wave electron microscopy to research on the sliding wear break-in behavior of a tarnished Cu-15wt% Zn alloy,’ in Proceedings, ‘Wear Materials’ (ASME, New York, 1985) pp. 424–431.

    Google Scholar 

  19. Blau, P. J. and Olson, C.D., ‘Thermal-wave microscopy for use in near surface crack depth and orientation determination in metallic materials,’ in Internal Report 85-3187 (National Bureau of Standards, Washington, DC, 1985) pp. 151–158.

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

About this article

Cite this article

Nguyen, T., Olson, C.D. Application of thermal-wave electron microscopy to imaging and assessment of corrosion on rough steel surface. Materials and Structures 22, 71–79 (1989). https://doi.org/10.1007/BF02472698

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF02472698

Keywords

Navigation