Properties of levenshtein metrics on sequences
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Levenshtein dissimilarity measures are used to compare sequences in application areas including coding theory, computer science and macromolecular biology. In general, they measure sequence dissimilarity by the length of a shortest weighted sequence of insertions, deletions and substitutions required, to transform one sequence into another. Those Levenshtein dissimilarity measures based on insertions and deletions are analyzed by a model involving valuations on a partially ordered set. The model reveals structural relationships among poset, valuation and dissimilarity measure. As a consequence, certain Levenshtein dissimilarity measures are shown to be metrics characterized by betweenness properties and computable in terms of well-known measures of sequence similarity.
KeywordsDissimilarity Measure Elementary Operation Longe Common Subsequence Lower Valuation Transitive Binary Relation
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