Diffractometric analysis of surface stresses in cubic polycrystals
Scientific And Technical Reports
- 18 Downloads
KeywordsSurface Stress Diffractometric Analysis
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
Unable to display preview. Download preview PDF.
- 1.D. M. Vasil'ev and V. V. Trofimov, "Current state of the x-ray-diffraction method for measuring microstresses," Zavod. Lab., No. 84/7, 20–29 (1984).Google Scholar
- 2.Yu. I. Sirotin and M. P. Shaskol'skaya, Fundamentals of Crystal Physics [in Russian], Nauka, Moscow (1979).Google Scholar
- 3.V. M. Danilenko, Models of Real Crystals [in Russian], Naukova Dumka, Kiev (1983).Google Scholar
- 4.V. V. Inozemtsev and L. D. Panteleev, "X-ray-diffraction investigation of the effect of irradiation with helium ions on the structure of 0KH16N15MZB steel and the alloy 0KH20N40M5GB," Voprosy Atomnoi Nauki i Tekhniki, Ser. Fizika Radiatsionnykh Povrezhdenii i Radiatsionnoe Materialovedenie, No. 1 (12), 57–66 (1980).Google Scholar
- 5.B. K. Vainshtein (ed.), Modern Crystallography [in Russian], Vol. 4, Nauka, Moscow (1981).Google Scholar
- 6.G. I. Aksenov and A. Ya. Natanzon, "Effect of the anisotropy of crystals on the structure of x-ray lines in the case of a stressed polycrystal," Fiz. Met. Metalloved.,42, No. 5, 954–964 (1976).Google Scholar
© Plenum Publishing Corporation 1995