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Conversion electron Mössbauer spectroscopy of r.f. sputtered Cd0.95 Fe0.05 Te thin films

  • Surface Phenomena, Catalysis, Corrosion
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Abstract

CEMS studies have been performed on Cd0.95 Fe0.05 Te films grown by r.f. supttering on quartz and silicon substrates. The dependence of the relative amount of Fe2+ and Fe3+ on substrate type, substrate temperature and annealing temperature is discussed.

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Authors and Affiliations

  1. Departmento de Física-Universidade Federal de Minas Gerais, 31170, C.P. 702, Belo Horizonte, Brazil

    E. Galvão da Silva

  2. Centro Brasileiro de Pesquisas Físicas Rua Xavier Sigaud, 150 22290, Rio de Janeiro, RJ, Brazil

    R. B. Scorzelli

  3. Centro de Investigaciones y Estudios Avanzados del IPN, Apartado Postal 14-740, 07000, Mexico-DF

    F. Sánchez-Sinencio,  Octavio-Alvarez-F & J. G. Mendoza-Alvarez

Authors
  1. E. Galvão da Silva
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  2. R. B. Scorzelli
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  3. F. Sánchez-Sinencio
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  4. Octavio-Alvarez-F
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  5. J. G. Mendoza-Alvarez
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Galvão da Silva, E., Scorzelli, R.B., Sánchez-Sinencio, F. et al. Conversion electron Mössbauer spectroscopy of r.f. sputtered Cd0.95 Fe0.05 Te thin films. Hyperfine Interact 57, 1839–1843 (1990). https://doi.org/10.1007/BF02405731

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