Journal of Materials Science

, Volume 19, Issue 1, pp 327–338 | Cite as

Radiation damage and high resolution electron microscopy of polydiacetylene crystals

  • R. T. Read
  • R. J. Young


The relationship between radiation damage and the application of high resolution electron microscopy (HREM) to polydiacetylene single crystals has been examined. The damage is seen to occur by the decay of electron diffraction patterns and the loss of contrast in bright- and dark-field micrographs. The rate of damage was found to be different for the two polydiacetylene derivatives studied and to take place probably by cross-linking. It was found that lattice images from planes parallel to the chain direction with a spacing of 0.9±0.1 nm could be obtained from the most resistant derivative. Images of chain-end dislocations were obtained for the first time in a polymer crystal. The problems of applying HREM to polymers and the conditions for imaging individual molecules are discussed.


Radiation Polymer Microscopy Electron Microscopy High Resolution 
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Copyright information

© Chapman and Hall Ltd 1984

Authors and Affiliations

  • R. T. Read
    • 1
  • R. J. Young
    • 1
  1. 1.Department of MaterialsQueen Mary CollegeLondonUK

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