Abstract
The relationship between radiation damage and the application of high resolution electron microscopy (HREM) to polydiacetylene single crystals has been examined. The damage is seen to occur by the decay of electron diffraction patterns and the loss of contrast in bright- and dark-field micrographs. The rate of damage was found to be different for the two polydiacetylene derivatives studied and to take place probably by cross-linking. It was found that lattice images from planes parallel to the chain direction with a spacing of 0.9±0.1 nm could be obtained from the most resistant derivative. Images of chain-end dislocations were obtained for the first time in a polymer crystal. The problems of applying HREM to polymers and the conditions for imaging individual molecules are discussed.
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References
G. Van Tendeloo,J. Microsc.119 (1980) 125.
N. W. Jepps andT. F. Page,ibid.119 (1980) 177.
L. A. Bursill andG. J. Wood,Phil. Mag.A38 (1978) 673.
V. E. Cosslett, R. A. Camps, W. O. Saxton, D. T. Smith, W. C. Nixon, H. Ahmed, C. J. D. Catto, J. R. A. Cleaver, K. C. A. Smith, A. E. Timbs, P. W. Turner andP. M. Ross,Nature281 (1979) 49.
Y. Murata, J. R. Fryer andT. Baird,J. Microsc.108 (1976) 261.
Y. Murata, J. R. Fryer, T. Baird andH. Murata,Acta Crystallogr.A33 (1977) 198.
J. R. Fryer,ibid.A34 (1978) 603.
J. R. Fryer,J. Microsc.120 (1980) 1.
D. J. Smith andJ. R. Fryer,Nature291 (1981) 481.
A. Keller,Koll. Z. u. Z. Polym.231 (1969) 386.
M. G. Dobb, D. J. Johnson andB. P. Saville,J. Polym. Sci. Polym. Symp.58 (1977) 237.
K. Shimamura, J. R. Minter andE. L. Thomas,J. Mater. Sci. Lett.2 (1983) 54.
R. T. Read andR. J. Young,J. Mater. Sci.16 (1981) 2922.
M. Tsuji, S. Isoda, M. Ohara, A. Kawaguchi andK. Katayama,Polymer23 (1982) 1568.
D. T. Grubb,J. Mater. Sci.9 (1974) 1715.
R. M. Glaeser in “Physical Aspects of Electron Microscopy and Microbeam Analysis”, edited by B. M. Siegel and D. R. Beaman (Wiley, New York, 1975).
E. Zeitler, EMAG 1981,Inst. Phys. Conf. Ser.61 (Inst. Phys., London, 1981).
W. Jones, in “Surface and Defect Properties of Solids” (Chem. Soc. Spec. Period. Rep.)5 (1976) 65.
D. J. Grubb andG. W. Groves,Phil. Mag.24 (1971) 815.
L. E. Thomas, C. J. Humphreys, W. R. Duff andD. T. Grubb,Radiation Effects3 (1970) 89.
J. R. Fryer,Proc. Roy. Microsc. Soc.17 (1982) 578.
N. Uyeda, J. Koboyashi, K. Ishizuka andY. Fujiyoshi,Chem. Scripta14 (1979) 47.
R. J. Young, R. T. Read andJ. Petermann,J. Mater. Sci.16 (1981) 1835.
R. J. Young andJ. Petermann,J. Polym. Sci. Polym. Phys. Ed.20 (1982) 961.
G. Wegner,Z. Naturforsch.24b (1969) 824.
K. C. Yee andR. R. Chance,J. Polym. Sci. Polym. Phys. Ed.16 (1978) 431.
A. Falls andE. L. Thomas, University of Massachusetts, private communication (1981).
J. C. H. Spence, “Experimental High Resolution Electron Microscopy” (Oxford University Press, Oxford, 1980).
J. W. Edington, “Monographs in Practical Electron Microscopy in Materials Science”1 (MacMillan, London, 1974).
R. C. Williams andH. W. Fisher,J. Mol. Biol.52 (1970) 121.
D. Kobelt andE. F. Paulus,Acta Crystallogr.B30 (1974) 232.
V. K. Enkelmann, R. J. Leyrer, G. Schleier andG. Wegner,J. Mater. Sci.15 (1980) 168.
J. Anstis andC. J. Humphreys, University of Oxford, private communication (1982).
P. Predecki andW. O. Statton,J. Appl. Phys.37 (1966) 4053.
J. M. Peterson,ibid.37 (1966) 4047.
R. J. Young,Phil. Mag.30 (1974) 85.
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Read, R.T., Young, R.J. Radiation damage and high resolution electron microscopy of polydiacetylene crystals. J Mater Sci 19, 327–338 (1984). https://doi.org/10.1007/BF02403142
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DOI: https://doi.org/10.1007/BF02403142