Advertisement

Hyperfine Interactions

, Volume 41, Issue 1, pp 725–728 | Cite as

Mössbauer spectroscopy and rutherford backscattering study of Co-Silicide surface layers on Si

  • A. Vantomme
  • I. Dézsi
  • G. Langouche
Surface Phenomena Catalysis

Keywords

Spectroscopy Thin Film Surface Layer 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. /1/.
    S.S. Lau, J.W. Mayer and K.N. Tu, J. Appl. Phys. 49 (1978) 4005.CrossRefADSGoogle Scholar
  2. /2/.
    G.J. van Gurp and C. Langereis, J. Appl. Phys. 46 (1975) 4301.CrossRefADSGoogle Scholar
  3. /3/.
    K.N. Tu, G. Ottaviani, R.D. Thompson and J.W. Mayer, J. Appl. Phys. 53 (1982) 4406.CrossRefADSGoogle Scholar
  4. /4/.
    I. Dézsi, H. Engelmann, U. Gonser and G. Langouche, Hyp. Int. 33 (1987) 161.Google Scholar
  5. /5/.
    I. Dézsi, R. Coussement, G. Langouche, B. Molnar, D.L. Nagy and M. de Potter, J. de Phys. 41 (1980) C1–425.Google Scholar
  6. /6/.
    G.K. Wertheim, J.H. Wernick and D.N.E. Buchanan, J. Appl. Phys. 37 (1966) 3333.CrossRefGoogle Scholar
  7. /7/.
    A. Vantomme, Graduatethesis, Leuven (1986) p. 84 (unpublished).Google Scholar

Copyright information

© J.C. Baltzer A.G., Scientific Publishing Company 1988

Authors and Affiliations

  • A. Vantomme
    • 1
  • I. Dézsi
    • 1
  • G. Langouche
    • 1
  1. 1.Instituut voor Kern-en StralingsfysikaUniversity of LeuvenLeuvenBelgium

Personalised recommendations