Abstract
The recent experimental data by I. S. Ghosh et al. (1994) on microwave losses induced by flux motion in YBCO thin films are discussed, which seem to contradict a generalized use of the surface resistance model proposed by Coffey and Clem (1992) in the field range 0–8 Tesla. It is found that the necessary condition, in order to reproduce the upward curvature vs. field observed for B‖BMW‖ film surface, is to assume that the Campbell penetration depth is governed by a critical field dependence reminishent of the well known Bc∝(1−t)3/2 expression. Nevertheless, the experimental data for the perpendicular case B⊥BMW and the behaviours in very low fields for both orientations cannot be satisfactorily explained in this view. It is shown that the discrepancies may be rationalized in a quite natural way as due to losses in a network of Josephson junctions of an intrinsic species, located in the intragrain region of the film.
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Buluggiu, E. Upward curvature of the microwave surface resistance vs. field in YBCO films and the Clem's Rs model. J Low Temp Phys 106, 487–492 (1997). https://doi.org/10.1007/BF02399657
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DOI: https://doi.org/10.1007/BF02399657