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Effect of Xe ion irration of Fe/Sn bilayers

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Abstract

Films of Fe (20 nm) and Sn (40 nm) have been deposited by PVD onto Al supports and irradiated with 100 keV Xe ions at a dose of 5×1015 ions/cm2. Scanning electron microscopy (SEM) shows that the irregular morphology of deposited Sn is considerably flattened by irradiation, which produces also a noticeable sputtering of Sn. Conversion electron Mössbauer spectroscopy (CEMS) reveals the formation at the interface of a variety of intermetallic phases which is enhanced by irradiation. These phases, seem to be insensible to prolonged (several months) room temperature aging. Their thermal stability under annealing at temperature up to 523 K has also been investigated.

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Authors and Affiliations

  1. Sezione Materiali, Dipartimento di Ingegneria Meccanica, Università di Padova, Italy

    S. Moncher & G. Principi

  2. Dipartimento di Fisica, Università di Trento, Italy

    L. M. Gratton & C. Tosello

  3. Laboratory of Nuclear Chemistry, Eötvös Lorand University, Budapest, Hungary

    I. Czakó-Nagy & A. Vértes

Authors
  1. S. Moncher
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  2. G. Principi
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  3. L. M. Gratton
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  4. C. Tosello
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  5. I. Czakó-Nagy
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  6. A. Vértes
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Moncher, S., Principi, G., Gratton, L.M. et al. Effect of Xe ion irration of Fe/Sn bilayers. Hyperfine Interact 46, 535–540 (1989). https://doi.org/10.1007/BF02398240

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