CEMS studies of Sn−O thin films prepared by thermal evaporation
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Thermal evaporated thin Sn−O films subjected to annealing treatments in air in the range 473–1173 K and in Ar in the range 473–773 K followed by annealings in air up to 1373 K were studied by CEMS (Conversion Electron Mössbauer Spectroscopy). Complementary Mössbauer and X-ray measurements were also performed on SnO powder that underwent the same series of annealings. The presence of the intermediate oxide Sn3O4 was detected. A temptative hyperfine characterization for the Sn2+ site in Sn3O4 is given.
KeywordsOxide Spectroscopy Thin Film Evaporation Annealing Treatment
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- F. Lawson, Nature 215 (1967) 955.Google Scholar