Hyperfine Interactions

, Volume 67, Issue 1–4, pp 657–660 | Cite as

CEMS studies of Sn−O thin films prepared by thermal evaporation

  • M. S. Moreno
  • J. Desimoni
  • R. C. Mercader
  • A. G. Bibiloni
Non-Crystalline Materials

Abstract

Thermal evaporated thin Sn−O films subjected to annealing treatments in air in the range 473–1173 K and in Ar in the range 473–773 K followed by annealings in air up to 1373 K were studied by CEMS (Conversion Electron Mössbauer Spectroscopy). Complementary Mössbauer and X-ray measurements were also performed on SnO powder that underwent the same series of annealings. The presence of the intermediate oxide Sn3O4 was detected. A temptative hyperfine characterization for the Sn2+ site in Sn3O4 is given.

Keywords

Oxide Spectroscopy Thin Film Evaporation Annealing Treatment 

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Copyright information

© J.C. Baltzer A.G. Scientific Publishing Company 1991

Authors and Affiliations

  • M. S. Moreno
    • 1
  • J. Desimoni
    • 1
  • R. C. Mercader
    • 1
  • A. G. Bibiloni
    • 1
  1. 1.Depto. de Fisica, Fac. de Cs. ExactasUniversidad Nacional de La PlataLa PlataArgentina

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