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Hyperfine Interactions

, Volume 67, Issue 1–4, pp 657–660 | Cite as

CEMS studies of Sn−O thin films prepared by thermal evaporation

  • M. S. Moreno
  • J. Desimoni
  • R. C. Mercader
  • A. G. Bibiloni
Non-Crystalline Materials

Abstract

Thermal evaporated thin Sn−O films subjected to annealing treatments in air in the range 473–1173 K and in Ar in the range 473–773 K followed by annealings in air up to 1373 K were studied by CEMS (Conversion Electron Mössbauer Spectroscopy). Complementary Mössbauer and X-ray measurements were also performed on SnO powder that underwent the same series of annealings. The presence of the intermediate oxide Sn3O4 was detected. A temptative hyperfine characterization for the Sn2+ site in Sn3O4 is given.

Keywords

Oxide Spectroscopy Thin Film Evaporation Annealing Treatment 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

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Copyright information

© J.C. Baltzer A.G. Scientific Publishing Company 1991

Authors and Affiliations

  • M. S. Moreno
    • 1
  • J. Desimoni
    • 1
  • R. C. Mercader
    • 1
  • A. G. Bibiloni
    • 1
  1. 1.Depto. de Fisica, Fac. de Cs. ExactasUniversidad Nacional de La PlataLa PlataArgentina

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