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CEMS measurements at low temperatures with Fe-Implanted sapphire

  • Radiation Damage and Implantation
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Abstract

A single crystal of sapphire was implanted with 100-keV57Fe to a dose of 3.4×1015 ions/cm2. The charge states of iron ions were investigated with the CEMS technique at low temperatures. The formation of the observed charge states Fe2+(1) and Fe2+(2) were elucidated in terms of crystal structure.

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Fukumura, K., Kobayashi, T., Ohkubo, M. et al. CEMS measurements at low temperatures with Fe-Implanted sapphire. Hyperfine Interact 70, 889–892 (1992). https://doi.org/10.1007/BF02397470

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