Journal of Materials Science

, Volume 24, Issue 4, pp 1368–1372 | Cite as

A SEM (scanning electron microscopy)-based method to evaluate impurity segregation to prior austenite grain boundaries in high strength steels

  • Wei -Di Cao
  • Xiao -Ping Lu
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Abstract

The depth of grain boundary grooves on the etched surface of high strength Cr-Ni steels has been determined as a measure of P-segregation to prior austenite grain boundaries by a SEM (Scanning Electron Microscopy)-based grain boundary etching method (GEM). The mean depth and distribution of the depth can be decided by stereoscopy on the SEM micrographs of the replica of the etched surface. The results showed that the cast steel has less, but nonuniform P-segregation and the high temperature austenitization reduced the P-segregation on prior austenite grain boundaries in both steels.

Keywords

Polymer Microscopy Electron Microscopy Scan Electron Microscopy Austenite 

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Copyright information

© Chapman and Hall Ltd. 1989

Authors and Affiliations

  • Wei -Di Cao
    • 1
  • Xiao -Ping Lu
    • 1
  1. 1.Department of Mechanical EngineeringTsinghua UniversityBeijingChina

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