The EFG of the In-O-Bond In2O3, AgO and Ag2O
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PAC measurements on111In in In2O3, AgO and Ag2O were performed to study the influence of different oxygen coordinations to the EFG.111In was implanted at 500keV; in addition, AgO and Ag2O were irradiated in the cyclotron to produce111In via the (α, 2n) reaction. Using the point charge model and the known lattice structure of the oxides, the antishielding factor was calculated; it shows a strong dependence on the In-O bondlength.
KeywordsOxide Oxygen Thin Film Lattice Structure Strong Dependence
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