Hydrotechnical Construction

, Volume 2, Issue 6, pp 537–539 | Cite as

Reliability and accuracy of tests on semiconductor resistance telethermometers

  • E. A. Kogan
Promotion of Efficiency Through Exchange of Experience
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Conclusions

  1. 1.

    Tests on thermistors have shown that the prolonged effect of negative and room temperature does not disturb stability by more than 0.5°C over a prolonged period, in any case not less than three to four years.

     
  2. 2.

    The prolonged effect of high temperature (50–80°C) results in aging of the thermistors, disregard of which can result in errors up to 3–5°C for individual thermistors, but for the majority of tested thermistors the errors did not exceed 0.5–1°C.

     
  3. 3.

    When a greater measurement accuracy than ±0.5°C is required the thermistors must be aged at a temperature around 100°C for several weeks [3].

     
  4. 4.

    A check on the accuracy of the thermistor resistance-temperature relationships usually adopted indicated that within the calibration range 40–50°C this is valid with an accuracy to 0.5°C. At a removal from the calibration range of 30–40°C, deviations of the actual relationship from the assumed can amount ot 1–2°C. In order to eliminate these errors, particularly at negative temperatures, the calibration data must be extrapolated in accordance with more accurate R=f(T) relationships, or the calibration must embrace the whole range of possible temperatures, including intermediate points.

     
  5. 5.

    The tests, in addition to many years experience with semiconductor resistance thermometer in full-scale and laboratory investigations, have fully confirmed their high quality and have indicated possibilities of using this type of telethermometer for investigations on hydraulic engineering structures.

     

Keywords

Power Generation Laboratory Investigation Measurement Accuracy Power Engineer Renewable Energy Source 

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Literature Cited

  1. 1.
    Semiconductors in Science and Technology [in Russian], Vol. 1, AN SSSR (1957).Google Scholar
  2. 2.
    A. F. Ioffe, Semiconductors in Present day Physics [in Russian], AN SSSR (1954).Google Scholar
  3. 3.
    S. A. Frinberg, Semiconductors as Thermometers. Collection of Reports of the III International Symposium on Thermometers [in Russian] (1960).Google Scholar

Copyright information

© the American Society of Civil Engineers 1968

Authors and Affiliations

  • E. A. Kogan

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