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Analysis of the errors in measuring the wavelengths of x-ray spectral lines of multiply charged ions in a dense high-temperature plasma

  • Measurements of Ionizing Radiation
  • Published:
Measurement Techniques Aims and scope

Abstract

An analysis is given of typical errors in measuring the wavelengths of x-ray spectral lines of multiply charged ions formed in a dense high-temperature plasma. It is shown that the most important source of error is usually broadening of both the measured and reference (standard) spectral lines. A method is proposed and implemented for making precision wavelength measurements utilizing x-ray emission spectra from a recombining plasma.

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Authors
  1. A. Ya. Faenov
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 10, pp. 59–63, October, 1996.

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Faenov, A.Y. Analysis of the errors in measuring the wavelengths of x-ray spectral lines of multiply charged ions in a dense high-temperature plasma. Meas Tech 39, 1061–1067 (1996). https://doi.org/10.1007/BF02377478

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